Single-shot phase retrieval via Fourier ptychographic microscopy by Byoungho Lee, Jong-Young Hong, Dongheon Yoo, Jaebum Cho, Youngmo Jeong, Seokil Moon.
Phase retrieval is an important tool to unveil wavefront of light, especially in high performance microscopy such as Fourier ptychographic (FPM). In general phase-retrieval methods, the resolution and number measurements are a trade-off relationship. Inspired by FPM, we devise what believe novel microscopic method, termed single-shot FPM (SSFPM). our approach, imaging exceeds relationship that it enables phase for with single measurement. By placing lens array at plane objective lens, multiple intensity profiles required algorithm collected shot. To achieve enough redundancy data satisfying convergence condition specimen simultaneously illuminated light-emitting diodes. SSFPM reconstructs quantitative profile enhances sacrificed applying lens-array imaging. We demonstrate numerical simulation experiments. The prototype achieves lateral 3.10 μm over field view 0.34 mm2. Without interferometer or scanning devices, can reconstruct complex
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